This is the industry’s most comprehensive, authoritative, and practical guide to modern Signal Integrity (SI) test and measurement for high-speed digital designs. Three of the field’s leading experts guide you through systematically detecting, observing, analyzing, and rectifying both modern logic signal defects and embedded system malfunctions. The authors cover the entire life cycle of embedded system design from specification and simulation onward, illuminating key techniques and concepts with easy-to-understand illustrations. Writing for all electrical engineers, signal integrity engineers, and chip designers, the authors show how to use real-time test and measurement to address today’s increasingly difficult interoperability and compliance requirements. They also present detailed, start-to-finish case studies that walk you through commonly encountered design challenges, including ensuring that interfaces consistently operate with positive timing margins without incurring excessive cost; calculating total jitter budgets; and managing complex tradeoffs in high-speed serial interface design.

本書特色

Shows electronic systems design engineers how to use real world test and measurement techniques to eliminate SI problems from their systems

1 . Clarifies the complex process of detecting, analysing, and rectifying logic signal defects and embedded system malfunctions

2 . Addresses one of the main problems facing designers of modern semiconductors

3 . Authors are among the foremost authorities on the topic

4 . Fills a gap in the coverage of our Signal Integrity library